Bou-Sleiman, J.: search on Z-Library

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1

A 230 μW built-in on-chip auto-calibrating RF amplitude detector in 65 nm CMOS

Kifle, Yonatan, Alhawari, Mohammad, Bou-Sleiman, Sleiman, Saleh, Hani, Mohammad, Baker, Ismail, Mohammed

Journal:

Analog Integrated Circuits and Signal Processing

Year:

2019

Language:

english

File:

PDF, 1.97 MB

english, 2019

2

[IEEE 2016 41st International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz) - Copenhagen, Denmark (2016.9.25-2016.9.30)] 2016 41st International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz) - Tomography and image processing for polymer additive manufacturing characterization

Perraud, J. B., Obaton, A. F., Bou-Sleiman, J., Recur, B., Balacey, H., Darracq, F., Guillet, J. P., Mounaix, P.

Year:

2016

Language:

english

File:

PDF, 671 KB

english, 2016

3

[IEEE 2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS) - Columbus, OH, USA (2013.08.4-2013.08.7)] 2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS) - A nanoscale CMOS charge pump with near perfect current matching

Bou-Sleiman, Sleiman, Ismail, Mohammed

Year:

2013

Language:

english

File:

PDF, 844 KB

english, 2013

4

Dynamic Self-Regulated Charge Pump With Improved Immunity to PVT Variations

Bou-Sleiman, Sleiman, Ismail, Mohammed

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2014

Language:

english

File:

PDF, 3.18 MB

english, 2014

5

SPIE Proceedings [SPIE SPIE Security + Defence - Toulouse, France (Monday 21 September 2015)] Millimetre Wave and Terahertz Sensors and Technology VIII - Discrimination and identification of RDX/PETN explosives by chemometrics applied to terahertz time-domain spectral imaging

Salmon, Neil A., Jacobs, Eddie L., Bou-Sleiman, J., Perraud, J.-B., Bousquet, B., Guillet, J.-P., Palka, N., Mounaix, P.

Year:

2015

Language:

english

File:

PDF, 515 KB

english, 2015

6

Built-in-Self-Test and Digital Self-Calibration for RF SoCs || Efficient Testing for RF SoCs

Bou-Sleiman, Sleiman, Ismail, Mohammed

Year:

2012

Language:

english

File:

PDF, 338 KB

english, 2012

7

[IEEE 2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS) - Abu Dhabi, United Arab Emirates (2016.10.16-2016.10.19)] 2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS) - A 0.23 mW, On-Chip, self-calibrating RF amplitude detector in 65 nm CMOS

Kifle, Yonatan, Alhawari, Mohammad, Bou-Sleiman, Sleiman, Ismail, Mohammed

Year:

2016

Language:

english

File:

PDF, 536 KB

english, 2016

8

Built-in-Self-Test and Digital Self-Calibration for RF SoCs ||

Bou-Sleiman, Sleiman, Ismail, Mohammed

Year:

2012

Language:

english

File:

PDF, 1.49 MB

english, 2012

9

Commensal Gut Bacteria Buffer the Impact of Host Genetic Variants on Drosophila Developmental Traits under Nutritional Stress

Ma, Dali, Bou-Sleiman, Maroun, Joncour, Pauline, Indelicato, Claire-Emmanuelle, Frochaux, Michael, Braman, Virginie, Litovchenko, Maria, Storelli, Gilles, Deplancke, Bart, Leulier, François

Journal:

Year:

2019

Language:

english

File:

PDF, 20.88 MB

english, 2019

10

[IEEE 2011 18th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2011) - Beirut, Lebanon (2011.12.11-2011.12.14)] 2011 18th IEEE International Conference on Electronics, Circuits, and Systems - Enabling efficient built-in-self-calibration for RFICs

Bou-Sleiman, Sleiman, Ismail, Mohammed

Year:

2011

Language:

english

File:

PDF, 642 KB

english, 2011

11

[IEEE 2011 18th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2011) - Beirut, Lebanon (2011.12.11-2011.12.14)] 2011 18th IEEE International Conference on Electronics, Circuits, and Systems - Mixed-Mode I/Q mismatches compensation in low-IF quadrature receivers

Naraharisetti, Naveen, Bou-Sleiman, Sleiman, Ismail, Mohammed

Year:

2011

Language:

english

File:

PDF, 1.05 MB

english, 2011

12

Terahertz imaging and tomography as efficient instruments for testing polymer additive manufacturing objects

Perraud, J. B., Obaton, A. F., Bou-Sleiman, J., Recur, B., Balacey, H., Darracq, F., Guillet, J. P., Mounaix, P.

Journal:

Year:

2016

Language:

english

File:

PDF, 573 KB

english, 2016

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